CBI Pro-Akademia

Method of semi-automatic measurement of the Slit Density Index (SDI) parameter for non-pressure samples and system for

Date added: 2025-10-09
Areas: Process engineering
Type: Patent or patent application

Author / authors

Rafał Majzer

Rafał Majzer

Engineering and technology

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Marcin Siedlecki

Marcin Siedlecki

Engineering and technology

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